Evidence of an identical firing-activated carrier-induced defect in monocrystalline and multicrystalline silicon

Autor: Chen, Daniel, Kim, Moonyong, Stefani, Bruno V., Hallam, Brett J., Abbott, Malcolm D., Chan, Catherine E., Chen, Ran, Payne, David N.R., Nampalli, Nitin, Ciesla, Alison, Fung, Tsun H., Kim, Kyung, Wenham, Stuart R.
Zdroj: In Solar Energy Materials and Solar Cells December 2017 172:293-300
Databáze: ScienceDirect