Series resistance contribution of majority carriers in CELLO impedance analysis: Influence of wafer thickness variation
| Autor: | Wagner, Jan-Martin, Schütt, Andreas, Carstensen, Jürgen, Föll, Helmut |
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| Zdroj: | In Solar Energy Materials and Solar Cells March 2016 146:129-134 |
| Databáze: | ScienceDirect |
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