Analysis of correlation between irradiation produced C clusters and intentionally incorporated N impurity in SiC

Autor: Wang, Pengfei, Chen, Yawen, Zhu, Wei, Huang, Li, Chen, Jing, Hou, Beibei, Ruan, Yongfeng
Zdroj: In Diamond & Related Materials September 2012 29:48-51
Databáze: ScienceDirect