Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescence
| Autor: | Umezawa, Hitoshi, Kato, Yukako, Watanabe, Hideyuki, Omer, Ashraf M.M., Yamaguchi, Hirotaka, Shikata, Shin-ichi |
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| Zdroj: | In Diamond & Related Materials 2011 20(4):523-526 |
| Databáze: | ScienceDirect |
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