Structural defects in (100) 3C-SiC heteroepitaxy: Influence of the buffer layer morphology on generation and propagation of stacking faults and microtwins
| Autor: | Severino, A., Frewin, C., Bongiorno, C., Anzalone, R., Saddow, S.E., La Via, F. |
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| Zdroj: | In Diamond & Related Materials 2009 18(12):1440-1449 |
| Databáze: | ScienceDirect |
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