Microstructure of diamond–SiC nanocomposites determined by X-ray line profile analysis

Autor: Gubicza, J., Ungár, T., Wang, Y., Voronin, G., Pantea, C., Zerda, T.W.
Zdroj: In Diamond & Related Materials 2006 15(9):1452-1456
Databáze: ScienceDirect