Operando electrical biasing TEM experiments of Ge-rich GST thin films with FIB sample preparation
| Autor: | Zhang, Leifeng, Park, Bumsu, Chapuis, Lucas, Gruel, Kilian, Cours, Robin, Lorut, Frédéric, Hÿtch, Martin, Gatel, Christophe |
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| Zdroj: | In Journal of Alloys and Compounds 25 October 2024 1003 |
| Databáze: | ScienceDirect |
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