Defect-mediated Z-scheme carriers’ dynamics of C-ZnO/A-CN toward highly enhanced photocatalytic TC degradation

Autor: Huang, Xiaoyan, Zhang, Xiuyun, Zhang, Kexiang, Xue, Xiaogang, Xiong, Jian, Huang, Yu, Zhang, Doudou, Zhang, Jian, Zhang, Zheling, Yan, Fengpo
Zdroj: In Journal of Alloys and Compounds 5 October 2021 877
Databáze: ScienceDirect
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