Determination of dislocation density in GaN/sapphire layers using XRD measurements carried out from the edge of the sample
| Autor: | Serafińczuk, Jarosław, Moszak, Karolina, Pawlaczyk, Łukasz, Olszewski, Wojciech, Pucicki, Damian, Kudrawiec, Robert, Hommel, Detlef |
|---|---|
| Zdroj: | In Journal of Alloys and Compounds 5 June 2020 825 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect