Analysis of the back-barrier effect in AlGaN/GaN high electron mobility transistor on free-standing GaN substrates

Autor: Liu, Xinke, Wang, Hao-Yu, Chiu, Hsien-Chin, Chen, Yuxuan, Li, Dabing, Huang, Chong-Rong, Kao, Hsuan-Ling, Kuo, Hao-Chung, Huang Chen, Sung-Wen
Zdroj: In Journal of Alloys and Compounds 25 January 2020 814
Databáze: ScienceDirect