X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions
| Autor: | Ievtushenko, A., Khyzhun, O., Shtepliuk, I., Bykov, O., Jakieła, R., Tkach, S., Kuzmenko, E., Baturin, V., Karpenko, О., Olifan, O., Lashkarev, G. |
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| Zdroj: | In Journal of Alloys and Compounds 25 October 2017 722:683-689 |
| Databáze: | ScienceDirect |
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