Effects of top-layer thickness on electrical performance and stability in VZTO/ZTO bi-layer thin-film transistors
| Autor: | Yun, Myeong Gu, Ahn, Cheol Hyoun, Kim, Ye Kyun, Cho, Sung Woon, Cho, Hyung Koun, Kim, Hyoungsub |
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| Zdroj: | In Journal of Alloys and Compounds 5 July 2016 672:449-456 |
| Databáze: | ScienceDirect |
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