Interface characterization and atomic intermixing processes in Be/W bilayers deposited on Si(0 0 1) substrates with Fe buffer layers

Autor: Kuncser, V., Palade, P., Schinteie, G., Sandu, S.G., Trupina, L., Lungu, G.A., Gheorghe, N.G., Teodorescu, C.M., Porosnicu, C., Jepu, I., Lungu, C.P., Filoti, G.
Zdroj: In Journal of Alloys and Compounds 25 January 2012 512(1):199-206
Databáze: ScienceDirect