Electron-backscattered diffraction and transmission electron microscopy study of post-creep Ti 3SiC 2
| Autor: | Barcelo, F., Doriot, S., Cozzika, T., Le Flem, M., Béchade, J.L., Radovic, M., Barsoum, M.W. |
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| Zdroj: | In Journal of Alloys and Compounds 2009 488(1):181-189 |
| Databáze: | ScienceDirect |
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