Nanosecond laser damage of 532 nm thin film polarizers evaluated by different testing protocols
| Autor: | Liu, Xuyi, Feng, Cao, Zhang, Weili, Nasibli, Humbet, Zhao, Yuan'an, Liu, Xiaofeng, Shuai, Kun, Shao, Jianda |
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| Zdroj: | In Optical Materials March 2024 149 |
| Databáze: | ScienceDirect |
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