Electrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bath

Autor: Diliegros-Godines, C.J., Lombardero-Juarez, D.I., Machorro-Mejía, R., González, R. Silva, Pal, Mou
Zdroj: In Optical Materials May 2019 91:147-154
Databáze: ScienceDirect