Defect reduction in GaN on dome-shaped patterned-sapphire substrates

Autor: Chen, Po-Hsun, Su, Vin-Cent, Wu, Shang-Hsuan, Lin, Ray-Ming, Kuan, Chieh-Hsiung
Zdroj: In Optical Materials February 2018 76:368-374
Databáze: ScienceDirect