Sub-micrometric patterns written using a DIL method coupled to a TiO2 photo-resist

Autor: Gâté, V., Jourlin, Y., Vocanson, F., Dellea, O., Vercasson, G., Reynaud, S., Riassetto, D., Langlet, M.
Zdroj: In Optical Materials July 2013 35(9):1706-1713
Databáze: ScienceDirect