Evaluation of free carrier losses to 1.54 μm emission in Si/Si:Er nanolayers on SOI substrate for optical gain observation
| Autor: | Ha, N.N. ⁎, Dohnalová, K., Gregorkiewicz, T. |
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| Zdroj: | In Optical Materials 2011 33(7):1094-1096 |
| Databáze: | ScienceDirect |
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