Growth and structural characterisation of Si/SiGe heterostructures for optoelectronic applications

Autor: Li, X.B., Neave, J.H., Norris, D.J., Cullis, A.G., Paul, D.J., Kelsall, R.W., Zhang, J.
Zdroj: In Optical Materials 2005 27(5):855-858
Databáze: ScienceDirect