Growth and characterization of SiON thin films by using thermal-CVD machine

Autor: Pandey, R.K., Patil, L.S., Bange, J.P., Patil, D.R., Mahajan, A.M., Patil, D.S., Gautam, D.K.
Zdroj: In Optical Materials 2004 25(1):1-7
Databáze: ScienceDirect