Current-induced degradation behaviors of InGaN/GaN multiple quantum well UV photodetectors: Role of electrically active defects
Autor: | Dalapati, Pradip a, ⁎, Almalki, Abdulaziz b, c, Alhassan, Sultan b, Alotaibi, Saud b, Huwayz, Maryam Al b, Nakabayashi, Taiki a, Egawa, Takashi a, d, Miyoshi, Makoto a, d, Henini, Mohamed b |
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Zdroj: | In Sensors and Actuators: A. Physical 1 November 2022 347 |
Databáze: | ScienceDirect |
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