Electronic imaging of subcritical defect accumulation in single crystal silicon under fatigue loading
| Autor: | Kamiya, Shoji, Kongo, Akira, Sugiyama, Hiroko, Izumi, Hayato |
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| Zdroj: | In Sensors and Actuators: A. Physical 15 August 2018 279:705-711 |
| Databáze: | ScienceDirect |
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