Defect accumulation and strength reduction in single crystalline silicon induced by cyclic compressive stress
| Autor: | Kamiya, Shoji, Kita, Toshifumi, Izumi, Hayato |
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| Zdroj: | In Sensors & Actuators: A. Physical 1 February 2014 208:30-36 |
| Databáze: | ScienceDirect |
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