A low-cost MEMS tester for measuring single nanostructure's thermal conductivity
Autor: | Xu, Weihe, Li, Jinwei, Zhang, Guitao, Chen, Xi, Galos, Richard, Hadim, Hamid, Lu, Ming, Shi, Yong |
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Zdroj: | In Sensors & Actuators: A. Physical 1 March 2013 191:89-98 |
Databáze: | ScienceDirect |
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