Reducing stiction in microelectromechanical systems by rough nanometer-scale films grown by atomic layer deposition

Autor: Puurunen, R.L., Häärä, A., Saloniemi, H., Dekker, J., Kainlauri, M., Pohjonen, H., Suni, T., Kiihamäki, J., Santala, E., Leskelä, M., Kattelus, H.
Zdroj: In Sensors & Actuators: A. Physical December 2012 188:240-245
Databáze: ScienceDirect