Effect of post-release sidewall morphology on the fracture and fatigue properties of polycrystalline silicon structural films

Autor: Alsem, D.H., Boyce, B.L., Stach, E.A., Ritchie, R.O.
Zdroj: In Sensors & Actuators: A. Physical 2008 147(2):553-560
Databáze: ScienceDirect