Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces

Autor: Bilbao-Guillerna, A., Eachambadi, R.T., Cadot, G.B.J., Axinte, D.A., Billingham, J., Stumpf, F., Beuer, S., Rommel, M.
Zdroj: In Journal of Materials Processing Tech. February 2018 252:636-642
Databáze: ScienceDirect
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