Electrical characterization of 6H–SiC enhancement-mode MOSFETs at high temperatures
| Autor: | Schmid, U *, Sheppard, S.T, Wondrak, W, Niemann, E |
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| Zdroj: | In Materials Science & Engineering B 1999 61:493-496 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Schmid, U *, Sheppard, S.T, Wondrak, W, Niemann, E |
|---|---|
| Zdroj: | In Materials Science & Engineering B 1999 61:493-496 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect