Investigation on electrical parameters between single and double material gate nanoribbon FETs including trap distributions
Autor: | Rai, Shashank, Tiwari, Shreyas, Chaudhary, Rashi, Saha, Rajesh, Sharma, Ritu |
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Zdroj: | In Materials Science & Engineering B May 2024 303 |
Databáze: | ScienceDirect |
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