Evaluation of nanostructured BiZn0.5Ti0.5O3 thin films deposited by RF magnetron sputtering
Autor: | Romaguera-Barcelay, Y., Pedraça, A.S., Moreira, J.A., Almeida, A., Tavares, P.B., Brito, W.R., Matos, R.S., Pires, M.A., Pinto, E.P., da Fonseca Filho, H.D. |
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Zdroj: | In Materials Science & Engineering B May 2021 267 |
Databáze: | ScienceDirect |
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