Evaluation of nanostructured BiZn0.5Ti0.5O3 thin films deposited by RF magnetron sputtering

Autor: Romaguera-Barcelay, Y., Pedraça, A.S., Moreira, J.A., Almeida, A., Tavares, P.B., Brito, W.R., Matos, R.S., Pires, M.A., Pinto, E.P., da Fonseca Filho, H.D.
Zdroj: In Materials Science & Engineering B May 2021 267
Databáze: ScienceDirect