Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis
| Autor: | Stakhira, Pavlo Y., Grygorchak, Ivan I., Cherpak, Vladyslav V., Ivastchyshyn, Fedir O., Volynyuk, Dmytro Y., Luka, Grzegorz, Godlewski, Marek, Guziewicz, Elzbieta, Pakhomov, Georgi L., Hotra, Zenon Y. |
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| Zdroj: | In Materials Science & Engineering B 2010 172(3):272-275 |
| Databáze: | ScienceDirect |
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