Nanostructural characterization of TiN-Ni films: A XAFS study

Autor: Pinakidou, F., Katsikini, M., Paloura, E.C., Akbari, A., Riviere, J.P.
Zdroj: In Materials Science & Engineering B 2011 176(6):473-476
Databáze: ScienceDirect