Evaluation of local strain in Si using UV-Raman spectroscopy
Autor: | Ogura, Atsushi, Kosemura, Daisuke, Takei, Munehisa, Uchida, Hidetsugu, Hattori, Nobuyoshi, Yoshimaru, Masaki, Mayuzumi, Satoru, Wakabayashi, Hitoshi |
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Zdroj: | In Materials Science & Engineering B 2009 159:206-211 |
Databáze: | ScienceDirect |
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