Evaluation of local strain in Si using UV-Raman spectroscopy

Autor: Ogura, Atsushi, Kosemura, Daisuke, Takei, Munehisa, Uchida, Hidetsugu, Hattori, Nobuyoshi, Yoshimaru, Masaki, Mayuzumi, Satoru, Wakabayashi, Hitoshi
Zdroj: In Materials Science & Engineering B 2009 159:206-211
Databáze: ScienceDirect