A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs
Autor: | Djeffal, F., Abdi, M.A., Dibi, Z., Chahdi, M., Benhaya, A. |
---|---|
Zdroj: | In Materials Science & Engineering B 2008 147(2):239-244 |
Databáze: | ScienceDirect |
Externí odkaz: |