Comprehensive modeling of ion-implant amorphization in silicon

Autor: Mok, K.R.C., Jaraiz, M., Martin-Bragado, I., Rubio, J.E., Castrillo, P., Pinacho, R., Srinivasan, M.P., Benistant, F.
Zdroj: In Materials Science & Engineering B 2005 124:383-385
Databáze: ScienceDirect