Highly strained InGaAs oxide confined VCSELs emitting in 1.25 μm

Autor: Chang, S.J. *, Yu, H.C., Su, Y.K., Chen, I.L., Lee, T.D., Lu, C.M., Chiou, C.H., Lee, Z.H., Yang, H.P., Sung, C.P.
Zdroj: In Materials Science & Engineering B 2005 121(1):60-63
Databáze: ScienceDirect