Hafnium silicon oxide films prepared by atomic layer deposition

Autor: Kukli, Kaupo, Ritala, Mikko, Leskelä, Markku, Sajavaara, Timo, Keinonen, Juhani, Gilmer, David C, Tobin, Philip J
Zdroj: In Materials Science & Engineering B 15 June 2004 109(1-3):2-5
Databáze: ScienceDirect