Structure and phase component of ZrO 2 thin films studied by Raman spectroscopy and X-ray diffraction
| Autor: | Duc Huy, Le, Laffez, P., Daniel, Ph., Jouanneaux, A., The Khoi, Nguyen, Siméone, D. |
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| Zdroj: | In Materials Science & Engineering B 2003 104(3):163-168 |
| Databáze: | ScienceDirect |
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