Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function
| Autor: | Glatzel, Th. *, Sadewasser, S., Shikler, R., Rosenwaks, Y., Lux-Steiner, M.Ch. |
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| Zdroj: | In Materials Science & Engineering B 2003 102(1):138-142 |
| Databáze: | ScienceDirect |
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