Study of trap centres in silicon nanocrystal memories
| Autor: | Souifi, A. *, Brounkov, P., Bernardini, S., Busseret, C., Militaru, L., Guillot, G., Baron, T. |
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| Zdroj: | In Materials Science & Engineering B 2003 102(1):99-107 |
| Databáze: | ScienceDirect |
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