Raman scattering, photoluminescence, and X-ray diffraction studies of GaN layers grown on misoriented sapphire substrates
| Autor: | Benyoucef, M *, Kuball, M, Koleske, D.D, Wickenden, A.E, Henry, R.L, Fatemi, M, Twigg, M.E |
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| Zdroj: | In Materials Science & Engineering B 2002 93(1):15-18 |
| Databáze: | ScienceDirect |
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