Deposition, evaluation and control of 4H and 6H SiC epitaxial layers for device applications

Autor: Neyret, E. *, Di Cioccio, L., Bluet, J.M., Pernot, J., Vicente, P., Anglos, D., Lagadas, M., Billon, T.
Zdroj: In Materials Science & Engineering B 2001 80(1):332-336
Databáze: ScienceDirect