In situ study by synchrotron X-ray diffraction of the motion of basal stacking faults during the reverse-phase transformation of a Cu–Zn–Al single crystal
| Autor: | Jourdan, C. *, Gastaldi, J., Baronnet, A., Belkahla, S., Guénin, G. |
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| Zdroj: | In Materials Science & Engineering A 1999 266(1):191-197 |
| Databáze: | ScienceDirect |
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