Interfacial microstructure evolution and properties of Sn-0.3Ag-0.7Cu–xSiC solder joints

Autor: Yin, Limeng, Zhang, Zhongwen, Su, Zilong, Zhang, Hehe, Zuo, Cunguo, Yao, Zongxiang, Wang, Gang, Zhang, Long, Zhang, Yupeng
Zdroj: In Materials Science & Engineering A 30 March 2021 809
Databáze: ScienceDirect