Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging of deuterium assisted cracking in a 2205 duplex stainless steel micro-structure
| Autor: | Sobol, Oded, Holzlechner, Gerald, Nolze, Gert, Wirth, Thomas, Eliezer, Dan, Boellinghaus, Thomas, Unger, Wolfgang E.S. |
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| Zdroj: | In Materials Science & Engineering A 31 October 2016 676:271-277 |
| Databáze: | ScienceDirect |
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