Quantification of void network architectures of suspension plasma-sprayed (SPS) yttria-stabilized zirconia (YSZ) coatings using Ultra-small-angle X-ray scattering (USAXS)

Autor: Bacciochini, Antoine, Ilavsky, Jan, Montavon, Ghislain, Denoirjean, Alain, Ben-ettouil, Fadhel, Valette, Stéphane, Fauchais, Pierre, Wittmann-teneze, Karine
Zdroj: In Materials Science & Engineering A 2010 528(1):91-102
Databáze: ScienceDirect