Defect states at silicon surfaces
| Autor: | Reddy, A.J. *, Chan, J.V., Burr, T.A., Mo, R., Wade, C.P., Chidsey, C.E.D., Michel, J., Kimerling, L.C. |
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| Zdroj: | In Physica B: Physics of Condensed Matter 15 December 1999 273-274:468-472 |
| Databáze: | ScienceDirect |
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