The presence of C/ω-V and G/ω-V peaks profile of Ag/SnO2/n-Si/Au MOS junction for capacitor applications
| Autor: | Benhaliliba, M., Benouis, C.E., Aldemir, D. Ali |
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| Zdroj: | In Physica B: Physics of Condensed Matter 1 November 2019 572:175-183 |
| Databáze: | ScienceDirect |
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