Strain relaxation mechanism in the Si-SiO2 system and its influence on the interface properties

Autor: Kropman, D., Mellikov, E., Öpik, A., Lott, K., Volobueva, O., Kärner, T., Heinmaa, I., Laas, T., Medvid, A.
Zdroj: In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):5153-5155
Databáze: ScienceDirect